Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
C. Di
Observed names:
Di, C,
Di, C Chennian
Institution:
Eindhoven University of Technology
Observed institutions:
IBM (United States),
Eindhoven University of Technology
OpenAlex ID:
A5111931685
IC defect sensitivity for footprint-type spot defects
1992
·
J. Pineda de Gyvez
, C. Di
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
93
PDF
Probability analysis for CMOS floating gate faults
2002
·
H. Xue
, C. Di
, et al.
·
European Design and Test Conference
·
47
On accurate modeling and efficient simulation of CMOS opens
2002
·
C. Di
, J.A.G. Jess
·
IEEE International Test Conference (ITC)
·
31
An efficient CMOS bridging fault simulator: with SPICE accuracy
1996
·
C. Di
, J.A.G. Jess
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
25
PDF
A net-oriented method for realistic fault analysis
2002
·
H. Xue
, C. Di
, et al.
·
International Conference on Computer Aided Design
·
24
Fast multi-layer critical area computation
2002
·
H. Xue
, C. Di
, et al.
·
Proceedings
·
12
A spot-defect to fault collapsing technique
2002
·
C. Di
, J. Pineda de Gyvez
·
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
·
3
PDF
The analysis of spot defect induced faults in MOS circuits
2002
·
C. Di
, J. Pineda de Gyvez
·
1
On the development of a fast and accurate bridging fault simulator
1994
·
C. Di
, Jag Jochen Jess
·
TU/e Research Portal
·
1
PDF
Modeling and simulation of defect induced faults in CMOS IC's
1995
·
Di, C Chennian
·
TU/e Research Portal
An improvement of a fast and accurate CMOS bridging fault simulator
1995
·
C. Di
, J.A.G. Jess
·
TU/e Research Portal
Show more works
View as search
Works count:
12
Citation count:
237
H-index:
6
I10-index:
6
Year
Topic
Type
