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Kan Nakayama

Automatic high-precision calibration system for angle encoder (II)
2003 · Tsukasa Watanabe, Hiroyuki Fujimoto, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 61
Automatic high-precision calibration system for angle encoder
2001 · Tsukasa Watanabe, Hiroyuki Fujimoto, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 48
Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
1970 · Hiroo Hashizume, Kan Nakayama, et al. · Journal of the Physical Society of Japan · 32
A New Optical Interferometer for Absolute Measurement of Linear Displacement in the Subnanometer Range
1983 · Mitsuru Tanaka, Kan Nakayama · Japanese Journal of Applied Physics · 30
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Use of Asymmetric Dynamical Diffraction of X-rays for Multiple-Crystal Arrangements of the (n1, +n2)Setting
1973 · Kan Nakayama, Hiroo Hashizume, et al. · Zeitschrift für Naturforschung A · 30
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Linewidth Measurement by a New Scanning Tunneling Microscope
1989 · Hirofumi Yamada, Toru Fujii, et al. · Japanese Journal of Applied Physics · 22
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High-Resolution Measurements of Nuclear Bragg Scattering from a Synthetic α-57Fe2O3 Crystal
1991 · Seishi Kikuta, Yoshitaka Yoda, et al. · Japanese Journal of Applied Physics · 20
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Absolute Measurement of Lattice Spacing d(220) in Floating Zone Silicon Crystal
1995 · Hiroyuki Fujimoto, Kan Nakayama, et al. · Japanese Journal of Applied Physics · 19
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Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
1993 · Masami Kageshima, Hirofumi Yamada, et al. · Japanese Journal of Applied Physics · 18
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Automatic High Precision Calibration System for Rotary Encoder
2001 · Tsukasa WATANABE, Tadashi MASUDA, et al. · Journal of the Japan Society for Precision Engineering · 16
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Light Bounces in Two-Beam Scanning Laser Interferometers
2000 · Hiroyuki Fujimoto Hiroyuki Fujimoto, Giovanni Mana Giovanni Mana, et al. · Japanese Journal of Applied Physics · 11
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A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter
2007 · Hiroyuki Fujimoto, Giovanni Mana, et al. · IEEE Transactions on Instrumentation and Measurement · 9
Imaging of Organic Molecules by Atomic Force Microscopy
1993 · Hirofumi Yamada Hirofumi Yamada, Kan Nakayama Kan Nakayama · Japanese Journal of Applied Physics · 9
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Precision Goniometer for Fine Adjustment in the Nanoradian Range
1982 · Mitsuru Tanaka, Kan Nakayama · Japanese Journal of Applied Physics · 8
Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
1971 · Kan Nakayama, Hiroo Hashizume, et al. · Journal of the Physical Society of Japan · 6
Monolithic Goniometer for Pure Rotation and Fine Orientation Control
1982 · Mitsuru Tanaka, Kan Nakayama · Japanese Journal of Applied Physics · 5
A New Angular Shearing Interferometer for Collimation in the Nanoradian Range
1990 · Mitsuru Tanaka, Kan Nakayama · Japanese Journal of Applied Physics · 4
Construction of Two Crystal Component Neutron Interferometer
1978 · Seishi Kikuta, Toshio Takahashi, et al. · Journal of the Physical Society of Japan · 4
Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
1994 · Masami Kageshima, Hirofumi Yamada, et al. · Japanese Journal of Applied Physics · 3
Observation of X-Ray Interference Signals from a Two-Crystal X-Ray Interferometer
1982 · Kan Nakayama, Mitsuru Tanaka, et al. · 計量研究所報告 · 3
A New Result with a Two Crystal Component Neutron Interferometer
1979 · Seishi Kikuta, Toshio Takahashi, et al. · Journal of the Physical Society of Japan · 3
Nature of Tip-Sample Interaction in Dynamic Mode Atomic Force Microscopy
1997 · Masami Kageshima, Takahiro Imayoshi, et al. · Japanese Journal of Applied Physics · 2
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Neutron Bragg-Case Rocking Curves from the Front and Back Surfaces of a Silicon Crystal Plate
1978 · Seishi Kikuta, Toshio Takahashi, et al. · Journal of the Physical Society of Japan · 2
New beamline optics for the effective use of a wiggler beam
1998 · Kan Nakayama, Yosimasa Okada, et al. · Journal of Synchrotron Radiation · 1
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Error budget of step height and pitch measurement using a scanning tunneling microscope with a three-dimensional interferometer
1997 · Toru Fujii, Masataka Yamaguchi, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1
Works count: 40
Citation count: 370
H-index: 11
I10-index: 11
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