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Rob Delhez

Observed names: Delhez, R., Delhez, R. (author), Delhez, Rob, R . Delhez, R Delhez, R. Delhez
OpenAlex ID: A5111964887
Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis
1982 · R. Delhez, Th. H. de Keijser, et al. · Fresenius Zeitschrift für Analytische Chemie · 425
Line broadening analysis using integral breadth methods: a critical review
2004 · P. Scardi, M. Leoni, et al. · Journal of Applied Crystallography · 393
The effect of tensile deformation by in situ ultrasonic treatment on the microstructure of low-carbon steel
2013 · R.K. Dutta, R.H. Petrov, et al. · Acta Materialia · 192
Profile Analysis for Microcrystalline Properties by the Fourier and Other Methods
1988 · JI Langford, R Delhez, et al. · Australian Journal of Physics · 179
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X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities
2000 · L. Velterop, R. Delhez, et al. · Journal of Applied Crystallography · 161
Characterization of Al-Si-alloys rapidly quenched from the melt
1980 · A. Bendijk, R. Delhez, et al. · Journal of Materials Science · 156
Role of X-Ray Diffraction Analysis in Surface Engineering: Investigation of Microstructure of Nitrided Iron and Steels
1987 · R. Delhez, Th. H. de Keijser, et al. · Surface Engineering · 114
Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening
1994 · J. G. M. van Berkum, A. C. Vermeulen, et al. · Journal of Applied Crystallography · 100
On the origin of stress in magnetron sputtered TiN layers
2000 · J.-D. Kamminga, Th. H. de Keijser, et al. · Journal of Applied Physics · 94
A low-temperature study to examine the role of ε-martensite during strain-induced transformations in metastable austenitic stainless steels
2009 · K. Datta, R. Delhez, et al. · Acta Materialia · 93
Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis
1996 · J. G. M. van Berkum, R. Delhez, et al. · Acta Crystallographica Section A Foundations of Crystallography · 87
An improved α2elimination
1975 · R. Delhez, E. J. Mittemeijer · Journal of Applied Crystallography · 79
The optimum standard specimen for X-ray diffraction line-profile analysis
1995 · J. G. M. van Berkum, G. J. M. Sprong, et al. · Powder Diffraction · 70
New methods for diffraction stress measurement: a critical evaluation of new and existing methods
2000 · J.-D. Kamminga, Th. H. de Keijser, et al. · Journal of Applied Crystallography · 43
Size and Strain Parameters from Peak Profiles: Sense and Nonsense
1988 · R Delhez, ThR de Keijser, et al. · Australian Journal of Physics · 40
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Changes in the densities of dislocations on distinct slip systems during stress relaxation in thin aluminium layers: The interpretation of x-ray diffraction line broadening and line shift
1995 · A. C. Vermeulen, R. Delhez, et al. · Journal of Applied Physics · 39
A model for stress in thin layers induced by misfitting particles
1998 · J.-D Kamminga, Th.H de Keijser, et al. · Thin Solid Films · 37
Diffraction analysis of nonuniform stresses in surface layers: Application to cracked TiN coatings chemically vapor deposited on Mo
1996 · W.G. Sloof, B. J. Kooi, et al. · Journal of materials research/Pratt's guide to venture capital sources · 35
Corrections for the angle dependence of Lorentz polarization and structure factors in X-ray diffraction line profiles
1977 · R Delhez, E J Mittemeijer, et al. · Journal of Physics E Scientific Instruments · 30
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The elimination of an approximation in the Warren–Averbach analysis
1976 · R. Delhez, E. J. Mittemeijer · Journal of Applied Crystallography · 30
Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations
2000 · J.-D. Kamminga, R. Delhez · Journal of Applied Crystallography · 29
Structural inhomogeneities of AlSi alloys rapidly quenched from the melt
1982 · R. Delhez, Th. H. De Keijser, et al. · Journal of Materials Science · 26
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Smoothing of X-ray diffraction data andKα2elimination using penalized likelihood and the composite link model
2014 · Johan J. de Rooi, Niek M. van der Pers, et al. · Journal of Applied Crystallography · 25
Development of residual stress and surface cracks in laser treated low carbon steel
1991 · B.A. Van Brussel, H.J. Hegge, et al. · Scripta Metallurgica et Materialia · 19
Prediction and Measurement of Compressive and Tensile Stresses in Coatings of Tic and Tin Chemically Vapour Deposited on Various Substrates
1987 · W. G. Sloof, H. J. M. Rijpkema, et al. · Surface Engineering · 18
Works count: 120
Citation count: 2,855
H-index: 23
I10-index: 38
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