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M. Weiß
Observed names:
M Weiss,
Mario Weiss,
Mario Weiß,
Weiss, Mario
Institution:
Laboratoire de l'Intégration du Matériau au Système
Observed institutions:
Centre National de la Recherche Scientifique,
Université de Bordeaux,
Laboratoire de l'Intégration du Matériau au Système,
Université Bordeaux-I,
Technische Universität Dresden
OpenAlex ID:
A5111990295
Mutual thermal coupling in SiGe:C HBTs
2013
·
Mario Weiss
, Amit Kumar Sahoo
, et al.
·
Symposium on Microelectronics Technology and Devices
·
19
A scalable model for temperature dependent thermal resistance of SiGe HBTs
2013
·
Amit Kumar Sahoo
, Sebastien Fregonese
, et al.
·
IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
·
16
Characterization of intra device mutual thermal coupling in multi finger SiGe:C HBTs
2013
·
Mario Weiss
, Amit Kumar Sahoo
, et al.
·
IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
·
13
PDF
Transient electro-thermal characterization of Si–Ge heterojunction bipolar transistors
2012
·
Amit Kumar Sahoo
, Mario Weiß
, et al.
·
Solid-State Electronics
·
11
Scalable compact modeling for SiGe HBTs suitable for microwave radar applications
2011
·
S Lehmann
, M Weiss
, et al.
·
IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
·
11
80ns/45GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices
2013
·
Mario Weiß
, Sébastien Fregonese
, et al.
·
Solid-State Electronics
·
10
Electro-thermal dynamic simulation and thermal spreading impedance modeling of Si-Ge HBTs
2011
·
Amit Kumar Sahoo
, Sebastien Fregonese
, et al.
·
IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
·
10
Optimized Ring Oscillator With 1.65-ps Gate Delay in a SiGe:C HBT Technology
2013
·
Mario Weiss
, Cedric Majek
, et al.
·
IEEE Electron Device Letters
·
9
Characterization of self-heating in Si–Ge HBTs with pulse, DC and AC measurements
2012
·
Amit Kumar Sahoo
, Sébastien Fregonese
, et al.
·
Solid-State Electronics
·
4
Rigorous investigations of a SiGe:C BiCMOS ring oscillator with optimized gate delay
2012
·
M. Weiß
, Sahoo A.K.
, et al.
·
HAL
·
4
Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices
2014
·
Zimmer, Thomas
, Weiss, Mario
, et al.
·
HAL
(Invited) Electro-Thermal Characterization of SiGe HBT PA-Cells
2014
·
Thomas Zimmer
, Mario Weiß
, et al.
·
ECS Transactions
(Invited) Electro-Thermal Characterization of SiGe HBT PA-Cells
2014
·
Thomas Zimmer
, Mario Weiß
, et al.
·
ECS Meeting Abstracts
Electro-thermal characterization of advanced technologies
2014
·
T. Zimmer
, Khemchand Sahoo
, et al.
·
HAL
Final Version MWEISS Submission Number 130
2013
·
M. Weiß
, Amit Kumar Sahoo
, et al.
Electro-Thermal Characterization of SiGe HBT PA-Cells
2006
·
Thomas Zimmer
, M. Weiß
, et al.
·
Dialnet (Universidad de la Rioja)
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Works count:
16
Citation count:
107
H-index:
8
I10-index:
7
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