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J. Benbrik
Observed name:
Jihane Benbrik
Institution:
Mohamed I University
Observed institutions:
Centre National d'Études Spatiales,
Mohamed I University
OpenAlex ID:
A5113361756
Electrical degradation of CMOS devices due to focused ion beam exposure
2002
·
J. Benbrik
, P. Perdu
, et al.
·
International Symposium on Plasma Process-Induced Damage
·
7
Focused Ion Beam Irradiation Induced Damages on CMOS and Bipolar Technologies
1998
·
J. Benbrik
, G. Rolland
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
6
Induced damages on CMOS and bipolar integrated structures under focused ion beam irradiation
1998
·
J. Benbrik
, P. Perdu
, et al.
·
Microelectronics Reliability
·
6
Electrical characterization and modification of a microelectroMechanical system (MEMS) for extended mechanical reliability and fatigue testing
1998
·
D. Meunier
, R. Desplats
, et al.
·
Microelectronics Reliability
·
3
Performance Improvement of a SAC-OCDMA FSO System Under Climatic Conditions for Smart City Applications
2024
·
Sokaina Boukricha
, Jihane Benbrik
, et al.
·
Information systems engineering and management
2D physical simulation of degradation on transistors induced by FIB exposure of dielectric passivation
1999
·
J. Benbrik
, G. Rolland
, et al.
·
Microelectronics Reliability
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Works count:
6
Citation count:
22
H-index:
3
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