Author

Alois Bechteler

Observed names: A Bechteler, A. Bechteler
Institution: PNSensor (Germany)
OpenAlex ID: A5113516817
2004 · A. Sevinc, A. Bechteler, et al. · IEEE Microwave Magazine · 7
2012 · Sebastian Ihle, Ivan Ordavo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2019 · Adrian Niculae, Thiago Barros, et al. · Microscopy and Microanalysis · 3
2019 · Adrian Niculae, Thiago Barros, et al. · Microscopy and Microanalysis · 2
2017 · A. Schoning, R. Lackner, et al. · Microscopy and Microanalysis · 2
2016 · A. Niculae, A. Bechteler, et al. · Microscopy and Microanalysis · 2
2018 · A. Liebel, A. Schöning, et al. · Microscopy and Microanalysis · 1
2008 · A Niculae, H Soltau, et al. · Microscopy and Microanalysis · 1
2019 · Dieter Schlosser, Robert Hartmann, et al. · Acta Crystallographica Section A Foundations and Advances
2018 · A. Schoning, R. Lackner, et al. · Microscopy and Microanalysis
2009 · A. Simsek, O. Jaritschin, et al. · Powder Diffraction
Works count: 17
Citation count: 41
H-index: 4
I10-index: 1
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