Author

Thomas E. Dillon

Observed names: T. E. Dillon, T.E. Dillon, Thomas Dillon
OpenAlex ID: A5113528496
2003 · Anita Sure, Thomas Dillon, et al. · Optics Express · 159
1998 · Sean L. Rommel, Thomas E. Dillon, et al. · Applied Physics Letters · 108
1999 · S.L. Rommel, T.E. Dillon, et al. · IEEE Electron Device Letters · 33
1999 · Phillip E. Thompson, Karl D. Hobart, et al. · Applied Physics Letters · 31
2009 · Richard Martin, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 29
2013 · Christopher Schuetz, Richard Martin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 25
2009 · Christopher A. Schuetz, E. Lee Stein, Jr., et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21
2008 · Thomas Dillon, Janusz Murakowski, et al. · Optics Letters · 19
2015 · Richard D. Martin, Shouyuan Shi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 18
2012 · John P. Wilson, Christopher A. Schuetz, et al. · Applied Optics · 18
2018 · Elodie Choquet, A.J. Eldorado Riggs, et al. · Space Telescopes and Instrumentation: Optical, Infrared, and Millimeter Wave · 17
2015 · Thomas E. Dillon, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
2008 · Thomas Dillon, Mathew Zablocki, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 16
2010 · Thomas E. Dillon, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 15
2004 · Thomas E. Dillon, Anita Sure, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 15
2001 · K. D. Hobart, P. E. Thompson, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 14
2011 · Daniel G. Mackrides, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
2002 · S.L. Rommel, T.E. Dillon, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 11
2012 · Richard Martin, Christopher Schuetz, et al. · SPIE Newsroom · 10
2003 · Dennis W. Prather, Janusz A. Murakowski, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2011 · Richard D. Martin, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2011 · Thomas E. Dillon, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2009 · Thomas E. Dillon, Christopher A. Schuetz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2011 · Jesse P. Samluk, Christopher A. Schuetz, et al. · Journal of Infrared Millimeter and Terahertz Waves · 5
Works count: 50
Citation count: 708
H-index: 15
I10-index: 20
Year
Topic
Type