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Sharad C. Seth
Observed names:
S. C. Seth,
S. Seth,
S.C. Seth,
SHARAD SETH,
Seth, Sharad C.,
Sharad Seth
show all 6
Observed institutions:
University of Nebraska–Lincoln,
University of Nebraska at Omaha,
Rensselaer Polytechnic Institute,
University of Nebraska System,
Alcatel-Lucent (France),
Indian Institute of Technology Kanpur,
Tsinghua University
show all 7
OpenAlex ID:
A5113538569
A prototype document image analysis system for technical journals
1992
·
G. Nagy
, S. Seth
, et al.
·
Computer
·
376
Hierarchical Representation of Optically Scanned Documents
1984
·
George Nagy
, Sharad Seth
·
Lincoln (University of Nebraska)
·
258
PDF
A feature-based approach to conflation of geospatial sources
2004
·
Ashok Samal
, Sharad Seth
, et al.
·
International Journal of Geographical Information Systems
·
165
Syntactic segmentation and labeling of digitized pages from technical journals
1993
·
M. Krishnamoorthy
, G. Nagy
, et al.
·
IEEE Transactions on Pattern Analysis and Machine Intelligence
·
136
Fault coverage requirement in production testing of LSI circuits
1982
·
V.D. Agrawal
, S.C. Seth
, et al.
·
IEEE Journal of Solid-State Circuits
·
111
Document Analysis With an Expert System
1986
·
George Nagy
, Sharad C. Seth
, et al.
·
Elsevier eBooks
·
105
A statistical theory of digital circuit testability
1990
·
S.C. Seth
, V.D. Agrawal
, et al.
·
IEEE Transactions on Computers
·
94
PDF
A system for recognizing a large class of engineering drawings
1997
·
Yuhong Yu
, A. Samal
, et al.
·
IEEE Transactions on Pattern Analysis and Machine Intelligence
·
70
Characterizing the LSI Yield Equation from Wafer Test Data
1984
·
S.C. Seth
, V.D. Agrawal
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
69
A new model for computation of probabilistic testability in combinational circuits
1989
·
Sharad C. Seth
, Vishwani D. Agrawal
·
Integration
·
52
An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited
2002
·
D.V. Das
, S.C. Seth
, et al.
·
IEEE International Test Conference (ITC)
·
46
An Exact Analysis for Efficient Computation of Random-pattern Testability in Combinational Circuits
1986
·
Sharad Seth
, Bhargab B. Bhattacharya
, et al.
·
Lincoln (University of Nebraska)
·
46
PDF
Decoding Substitution Ciphers by Means of Word Matching with Application to OCR
1987
·
George Nagy
, Sharad Seth
, et al.
·
IEEE Transactions on Pattern Analysis and Machine Intelligence
·
44
Integrated text and line-art extraction from a topographic map
2000
·
Luyang Li
, George Nagy
, et al.
·
International Journal on Document Analysis and Recognition (IJDAR)
·
42
Diagnosis of Faults in Linear Tree Networks
1977
·
Sharad C. Seth
, K. L. Kodandapani
·
IEEE Transactions on Computers
·
41
Generating tests for delay faults in nonscan circuits
1993
·
P. Agrawal
, V.D. Agrawal
, et al.
·
IEEE Design & Test of Computers
·
36
Tutorial test generation for VLSI chips
1988
·
Vishwani D. Agrawal
, Sharad Seth
·
IEEE Computer Society Press , Order from IEEE Computer Society eBooks
·
31
STEM: Spatiotemporal Management of Capacity for Intra-core Last Level Caches
2010
·
Dongyuan Zhan
, Hong Jiang
, et al.
·
IEEE/ACM International Symposium on Microarchitecture (MICRO)
·
30
Converting heterogeneous statistical tables on the web to searchable databases
2016
·
David W. Embley
, Mukkai S. Krishnamoorthy
, et al.
·
International Journal on Document Analysis and Recognition (IJDAR)
·
27
Double-tree scan: a novel low-power scan-path architecture
2004
·
B.B. Bhattacharya
, S.C. Seth
, et al.
·
IEEE International Test Conference (ITC)
·
26
Isolating symbols from connection lines in a class of engineering drawings
1994
·
Yuhong Yu
, Ashok Samal
, et al.
·
Pattern Recognition
·
25
LSI Product Quality and Fault Coverage
1981
·
Vishwani D. Agrawal
, Sharad Seth
, et al.
·
Lincoln (University of Nebraska)
·
24
Segmenting Tables via Indexing of Value Cells by Table Headers
2013
·
Sharad Seth
, George Nagy
·
IAPR International Conference on Document Analysis and Recognition (ICDAR)
·
22
Cooperative text and line-art extraction from a topographic map
1999
·
Luyang Li
, G. Nagy
, et al.
·
IAPR International Conference on Document Analysis and Recognition (ICDAR)
·
22
PDF
On the Probability of Fault Occurrence
1989
·
Sharad C. Seth
, Vishwani D. Agrawal
·
Springer eBooks
·
22
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Works count:
142
Citation count:
2,533
H-index:
22
I10-index:
50
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