Author

J. Söllner

Observed names: J Sollner, J. Soellner, J. Sollner, J. SÖLLNER, Joerg Soellner, Soellner, J., Söllner, J.
Institution: Aixtron (Germany)
OpenAlex ID: A5113561698
1998 · M. Umlauff, J. Hoffmann, et al. · Physical review. B, Condensed matter · 137
1993 · C Stölzel, M. Siegel, et al. · Applied Physics Letters · 33
1995 · M. Umlauff, H. Kalt, et al. · Physical review. B, Condensed matter · 26
1998 · H. Kalt, M. Umlauff, et al. · Journal of Crystal Growth · 23
1997 · M. Heuken, J. Söllner, et al. · Journal of Crystal Growth · 23
1996 · R. Heitz, E. Moll, et al. · Journal of Crystal Growth · 23
1992 · M. Heuken, J. Söllner, et al. · Journal of Crystal Growth · 22
1998 · H. Kalt, M. Umlauff, et al. · Journal of Crystal Growth · 18
1991 · M. Heuken, J. Söllner, et al. · Materials Science and Engineering B · 15
1993 · G.J. Hofer, H.A. Kratz, et al. · IEEE Transactions on Applied Superconductivity · 14
1996 · G. Bacher, D. Tönnies, et al. · Journal of Applied Physics · 12
1995 · C. Boemare, B. Gil, et al. · Physical review. B, Condensed matter · 12
1994 · J. Söllner, M. Scholl, et al. · Journal of Crystal Growth · 12
1996 · A. L. Gurskii, A. N. Gavrilenko, et al. · physica status solidi (b) · 10
1996 · R. Spiegel, G. Bacher, et al. · Physical review. B, Condensed matter · 9
1991 · Joerg Soellner, Michael Heuken, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
1994 · J. Söllner, M. Scholl, et al. · Journal of Crystal Growth · 8
1992 · J. Hermans, V. Wagner, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 8
1995 · J. Söllner, J. Schmoranzer, et al. · Journal of Electronic Materials · 7
Works count: 66
Citation count: 573
H-index: 12
I10-index: 18
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