Author

Se Baek Oh

Observed names: O Se-Baek, Oh, Se Baek, S.B. Oh, SB Oh, Se B. Oh, Se Baek, Se Baek Oh (3975335), Se-Baek Oh, SeBaek Oh, Sebaek Oh, 오세백
OpenAlex ID: A5113607058
2012 · Tom Cuypers, Tom Haber, et al. · ACM Transactions on Graphics · 56
2012 · Lei Tian, Justin Lee, et al. · Optics Express · 49
2010 · Se Baek Oh, Sriram Kashyap, et al. · Computer Graphics Forum · 41
2010 · Sergei S. Orlov, Snezhana I. Abarzhi, et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences · 28
2010 · Yuan Luo, Se Baek Oh, et al. · Optics Letters · 27
2008 · Patrick Wissmann, Se Baek Oh, et al. · Optics Express · 25
2011 · Yuan Luo, Ioannis K. Zervantonakis, et al. · Journal of Biomedical Optics · 19
2013 · Se Baek Oh, Zhan-Qian John Lu, et al. · Optics Letters · 14
2009 · Oh, Se Baek, Barbastathis, George, et al. · arXiv (Cornell University) · 14
2010 · Roarke Horstmeyer, Se Baek Oh, et al. · Optics Express · 12
2001 · Kyung-Chan Kim, Se Baek Oh, et al. · Measurement Science and Technology · 12
2011 · Tom Cuypers, Roarke Horstmeyer, et al. · IEEE International Conference on Computational Photography (ICCP) · 11
2009 · Se Baek Oh, George Barbastathis · Optics Letters · 11
2001 · Se Baek Oh, Kyung-Chan Kim, et al. · Review of Scientific Instruments · 8
2005 · Won Chegal, Yong Jai Cho, et al. · Measurement Science and Technology · 6
2015 · Hsi-Hsun Chen, Se Baek Oh, et al. · Optics Express · 5
2009 · Se Baek Oh, George Barbastathis · Applied Optics · 5
2002 · Kyung-Chan Kim, Se-Baek Oh, et al. · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 5
2011 · Cuypers, Tom, Oh, Se Baek, et al. · arXiv (Cornell University) · 4
2011 · George Barbastathis, Justin W. Lee, et al. · Imaging and Applied Optics · 4
2009 · Se Baek Oh, Jonathan M. Watson, et al. · Applied Optics · 4
2001 · SeBaek Oh, Kyung-Chan Kim, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2009 · Se Baek Oh · DSpace@MIT (Massachusetts Institute of Technology) · 3
2011 · Yuan Luo, Ioannis Zervantonakis, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Works count: 85
Citation count: 386
H-index: 11
I10-index: 13
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