Author

H. Etienne

2008 · T. Sarnet, M. Halbwax, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 43
2011 · S. B. Felch, F. Torregrosa, et al. · AIP conference proceedings · 16
2009 · Wei-Yip Loh, H. Etienne, et al. · IEEE Electron Device Letters · 16
2011 · S. Felch, C. Hobbs, et al. · International Workshop on Junction Technology · 13
2008 · V. Vervisch, H. Etienne, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 9
2006 · S. Nizou, V. Vervisch, et al. · AIP conference proceedings · 8
2012 · A. Burenkov, A. Hahn, et al. · AIP conference proceedings · 6
2011 · S. B. Felch, H. Etienne, et al. · AIP conference proceedings · 5
2008 · H. Etienne, V. Vervisch, et al. · International Workshop on Junction Technology · 5
2008 · T. Sarnet, R. Torres, et al. · International Congress on Applications of Lasers & Electro-Optics (ICALEO) · 2
2015 · E.-A. Kouadri-boudjelthia, E. Ntsoenzok, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1
2011 · Y. Spiegel, F. Torregrosa, et al. · AIP conference proceedings
2010 · Torres, R., Derrien, T.J.Y., et al. · HAL
Works count: 19
Citation count: 367
H-index: 8
I10-index: 6
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