Author

Dong Ju Yang

Institution: Samsung Electronics (South Korea)

Observed institutions: Samsung (South Korea), Samsung Electronics (South Korea), Sungkyunkwan University

OpenAlex ID: A5113622636

Half-Buried Structure Cu Bus Line in TFT LCD

2010 · Hong Long Ning, Chang Oh Jeong, et al. · Key engineering materials · 1

Nondestructive Evaluation of CVD Diamond Coating Layers Using the Leaky Rayleigh Surface Wave

2006 · Wen Wu Wang, Sung Jin Song, et al. · Key engineering materials · 1

Oxide semiconductor TFTs for the next generation LCD-TV applications

2008 · Je Hun Lee, Do Hyun Kim, et al.

Nondestructive Evaluation of Titanium-Nitride Ceramic Coatings

2006 · Dong Ju Yang, Sung Jin Song, et al. · Key engineering materials

Works count: 4

Citation count: 2

H-index: 1

I10-index: