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Author

John S. Wei

Observed names: J. S. Wei, J. Wei, J.S. Wei
Institution: Bell (Canada)
Observed institution: Bell (Canada)
OpenAlex ID: A5113634244
A new method for determining thin-film refractive index and thickness using guided optical waves
1978 · John S. Wei, W. D. Westwood · Applied Physics Letters · 40
Variable refractive index and birefringent waveguides by sputtering tantalum in O_2–N_2 mixtures
1975 · S. J. Ingrey, W. D. Westwood, et al. · Applied Optics · 35
Coupling to film waveguides with reusable plastic gratings
1976 · J. S. Wei, C. C. Tan · Applied Optics · 5
Accurate phase-matching in sputtered birefringent Ta2O5Nx waveguides
1976 · J. Wei, S. J. Ingrey, et al. · Applied Physics Letters · 4
Erratum: A new method for determining thin-film refractive index and thickness using guided optical waves
1978 · John S. Wei, W. D. Westwood · Applied Physics Letters · 1
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An Attachable Plastic Grating Coupler for Integrated Optics
1976 · J.S. Wei, C.C. Tan · OSA Topical Meeting on Integrated Optics
Works count: 6
Citation count: 85
H-index: 4
I10-index: 2
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