Author

F. Rousseaux

1998 · C. Chappert, H. Bernas, et al. · Science · 801
1996 · Michel Hehn, Kamel Ounadjela, et al. · Science · 382
1998 · C. Mathieu, J. Jorzick, et al. · Physical Review Letters · 216
1999 · J. Jorzick, S. O. Demokritov, et al. · Physical review. B, Condensed matter · 203
1994 · M.A. El Khakani, M. Chaker, et al. · Journal of materials research/Pratt's guide to venture capital sources · 144
1978 · M. Lemonnier, R. Fourme, et al. · Nuclear Instruments and Methods · 120
1997 · C. Mathieu, C. Hartmann, et al. · Applied Physics Letters · 114
1995 · F. Rousseaux, D. Decanini, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 103
1999 · O. Fruchart, J.-P. Nozières, et al. · Physical Review Letters · 91
1998 · J.-P. Jamet, S. Lemerle, et al. · Physical review. B, Condensed matter · 89
1999 · J Ferré, C Chappert, et al. · Journal of Magnetism and Magnetic Materials · 88
1992 · E. Gat, M.A. El Khakani, et al. · Journal of materials research/Pratt's guide to venture capital sources · 83
1999 · J. Jorzick, S. O. Demokritov, et al. · Applied Physics Letters · 79
1997 · Corinne Miramond, Claude Fermon, et al. · Journal of Magnetism and Magnetic Materials · 68
1999 · W. Schwarzacher, O.I. Kasyutich, et al. · Journal of Magnetism and Magnetic Materials · 67
1996 · C. Vivensang, L. Ferlazzo-Manin, et al. · Diamond and Related Materials · 60
1994 · Y. Chen, R. K. Kupka, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 60
1997 · B. Hillebrands, C. Mathieu, et al. · Journal of Applied Physics · 59
1983 · M. Brunel, G. Patrat, et al. · Acta Crystallographica Section A Foundations of Crystallography · 53
2001 · J. Jorzick, C. Krämer, et al. · Journal of Applied Physics · 49
1983 · Daniel Guerard, Christophe Takoudjou, et al. · Synthetic Metals · 48
1990 · A. M. Haghiri-Gosnet, F. Rousseaux, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 43
2000 · Y. B. Xu, C. A. F. Vaz, et al. · Physical review. B, Condensed matter · 38
Works count: 134
Citation count: 4,488
H-index: 32
I10-index: 67
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