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Robbert H. Bergmans

Observed names: R Bergmans, R H Bergmans, R. H. Bergmans, R.H. Bergmans, Robbert Bergmans
OpenAlex ID: A5113691173
Comparison on Nanometrology: Nano 2—Step height
2003 · L Koenders, R Bergmans, et al. · Metrologia · 63
Virtual CMM using Monte Carlo methods based on frequency content of the error signal
2001 · Bas W. van Dorp, Han Haitjema, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 34
Ultra-high precision CMMs and their associated tactile or/and optical scanning probes
2014 · H. Nouira, R.H. Bergmans, et al. · International Journal of Metrology and Quality Engineering · 30
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An Elastically Guided Machine Axis with Nanometer Repeatability
2005 · J.K.v. Seggelen, P.C.J.N. Rosielle, et al. · CIRP Annals · 25
Comparison of asphere measurements by tactile and optical metrological instruments
2015 · R H Bergmans, H J Nieuwenkamp, et al. · Measurement Science and Technology · 15
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Intercomparison of flatness measurements of an optical flat at apertures of up to 150 mm in diameter
2017 · S Quabis, M Schulz, et al. · Metrologia · 10
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Toward interferometry for dimensional drift measurements with nanometer uncertainty
2011 · D Voigt, J D Ellis, et al. · Measurement Science and Technology · 10
Measurement of gauge blocks by interferometry
2016 · M Matus, S Haas, et al. · Metrologia · 4
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Automated Versus Manual Scan Positioning: a Quantitative Analysis
2006 · R. Springorum, F. Hoogenraad, et al. · 2
Calibration of nanosensors with direct traceability to the meter
2001 · Robbert H. Bergmans, Han Haitjema, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Final report on RMO key comparison EURAMET.L-K6: CMM 2-D artifact: ball plate
2013 · O Jusko, E Banreti, et al. · Metrologia · 1
Calibration of outer diameter standards (EURAMET.L-K4 2005.1)
2020 · R Koops, R Bergmans, et al. · Metrologia
Interferometry for picometer-level dimensional stability measurements
2011 · D. Voigt, J.D. Ellis, et al. · Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Absolute measurement of nanometer displacement with Fabry-Perot interferometry
2006 · S.A. van den Berg, P.J.M. van Kan, et al. · Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Design and calibration of an elastically guided CMM axis with nanometer repeatability
2005 · J. K. van Seggelen, P. C. Rosielle, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Development of a digital controller for iodine stabilized lasers
2003 · K. R. Koops, Robbert Bergmans, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 16
Citation count: 196
H-index: 7
I10-index: 7
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