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Weiyi Cao
Observed name:
Wei-Yi Cao
Institution:
Beijing Microelectronics Technology Institute
Observed institutions:
Chinese Academy of Sciences,
China Aerospace Science and Technology Corporation,
Beijing Microelectronics Technology Institute,
Beihang University
ORCID:
0009-0009-1776-9004
Observed ORCID:
0009-0009-1776-9004
OpenAlex ID:
A5114070815
TID-Induced OFF-State Leakage Current in Partially Radiation-Hardened SOI LDMOS
2020
·
Lei Shu
, Liang Wang
, et al.
·
IEEE Transactions on Nuclear Science
·
19
Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages
2022
·
Tongde Li
, Yuanfu Zhao
, et al.
·
IEEE Transactions on Nuclear Science
·
10
Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
2020
·
Lei Shu
, Chun-Hua Qi
, et al.
·
Microelectronics Reliability
·
7
Experiment and Simulation on Single-Event Transient Effects of the MOS Capacitor in LDO
2019
·
Chenglong Sui
, Liang Wang
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
·
7
TID-Induced Breakdown Voltage Degradation in Uniform and Linear Variable Doping SOI p-LDMOSFETs
2020
·
Lei Shu
, Yuan-Fu Zhao
, et al.
·
IEEE Transactions on Nuclear Science
·
6
Experiment and Simulation of Transient Ionizing Radiation Hardening in the 0.18μm CMOS LDO
2021
·
Weiyi Cao
, Yuanfu Zhao
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
·
5
Laser Simulation of Transient Ionizing Radiation Effects in the Double-Power Integrated Circuit
2020
·
Weiyi Cao
, Yuanfu Zhao
, et al.
·
International Conference on Electronics Technology (ICET)
·
4
Laser Simulation of Transient Ionizing Radiation Effects in the 0.18μm CMOS Inverter Chain
2019
·
Weiyi Cao
, Liang Wang
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
·
1
Total-Ionizing-Dose Response of RRAM-Based Computing-in-Memory Macro
2026
·
Tingrui Ren
, Weiyi Cao
, et al.
·
IEEE Transactions on Nuclear Science
Radiation Effects of a 128Mb NOR Type B4-Flash
2025
·
Anni Cao
, Yuanfu Zhao
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
A Radiation-Hardened Resistive Random Access Memory with High-Reliability Write and Read Scheme
2025
·
Weiyi Cao
, Yajiao Liu
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
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Works count:
11
Citation count:
59
H-index:
5
I10-index:
2
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