Author

Hosam Hatem

Institution: Siemens (Germany)

Observed institution: Siemens (Germany)

OpenAlex ID: A5117400976

AI-powered end-to-end product lifecycle: UX-centric human-in-the-loop system boosting reviewer productivity by 82% and accelerating decision-making via real-time anomaly detection and data refinement with GPU-accelerated computer vision, edge computing, and scalable cloud

2025 · Kiarash Ahi, Sherif Mansour, et al. · 2

AI-Powered Defect Detection using Deep Learning: A Pattern-Agnostic Faster R-CNN Approach for SEM Images with GPU Acceleration

2025 · Hosam Hatem, Amr Essam, et al. · Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

Works count: 2

Citation count: 2

H-index: 1

I10-index: