Author

Z. L. Zhang

Institution: Harbin Institute of Technology

Observed institution: Harbin Institute of Technology

ORCID: 0009-0008-5928-5115

Observed ORCID: 0009-0008-5928-5115

OpenAlex ID: A5121927770

Trap-induced degradation mechanisms in quasi-vertical GaN PiN diodes under the combined effects of high-energy heavy ion irradiation and off-state reverse bias

2026 · J. F. Qian, F. Zhou, et al. · Applied Physics Letters · 4

Works count: 1

Citation count: 4

H-index: 1

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