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Jinxiang Wang
Institution:
Harbin Institute of Technology
Observed institution:
Harbin Institute of Technology
ORCID:
0000-0002-5423-5409
Observed ORCID:
0000-0002-5423-5409
OpenAlex ID:
A5123440323
A Fast and Accurate Single-Event Transient Reliability Analysis of Logic Circuits Using Adaptive Importance Sampling Method
2026
·
Liangquan Qiao
, Fangfa Fu
, et al.
·
ACM Transactions on Design Automation of Electronic Systems
·
1
A Sub-1mV Voltage-Variation Pixel Power Supply Architecture with Radiation-Hardened Built-In LDO for Pixel Readout ASIC
2025
·
Lei Li
, Jinxiang Wang
, et al.
·
IEEE International Conference on ASIC (ASICON)
·
1
Soft-error tolerant design and assessment of the system-on-chip circuit for space application
2026
·
Haiwei Xue
, Fangfa Fu
, et al.
·
International Journal of Electronics
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Works count:
3
Citation count:
2
H-index:
1
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