Author

C. F. Jeff Wu

Observed name: Wu, C. F. Jeff

Institutions: Chinese University of Hong Kong, Chinese University of Hong Kong, Shenzhen

Observed institutions: Chinese University of Hong Kong, Chinese University of Hong Kong, Shenzhen

OpenAlex ID: A5152120143

Sampling-Based Batch Sequential Design by Stein Variational Gradient Descent

2026 · Fu, Penghui, Ding, Xiaoxian, et al. · arXiv (Cornell University)

Works count: 1

Citation count:

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