Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Jesus Diaz
OpenAlex ID:
A5153584285
Image-Based Quality Control for Additive Manufacturing through Layer-by-Layer Analysis
2026
·
Jesus Diaz
, Chaitanya Mahajan
, et al.
·
IISE Annual Conference & Expo
Show more works
View as search
Works count:
1
Citation count:
H-index:
I10-index:
Year
Topic
Type
