Author

Juhui Oh

Observed name: Oh, Juhui

Institution: Seoul National University

Observed institution: Seoul National University

OpenAlex ID: A5157967263

Optimization-Based Thickness Estimation and Depth-Resolved FIB-Induced Damage Characterization via Multislice Electron Ptychography

2026 · Park, Keun-Yeol, Shi, Chuqiao, et al. · arXiv (Cornell University)

Works count: 1

Citation count:

H-index:

I10-index: