J.A. Woollam Company (United States)

Homepage: jawoollam.com

ROR: 04a0z8p03

OpenAlex ID: I4210139455

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

1998 · C. M. Herzinger, B. Johs, et al. · Journal of Applied Physics · 1,085

Giant optical anisotropy in a quasi-one-dimensional crystal

2018 · Shanyuan Niu, Graham Joe, et al. · Nature Photonics · 483

Infrared dielectric anisotropy and phonon modes of sapphire

2000 · M. Schubert, T. E. Tiwald, et al. · Physical review. B, Condensed matter · 382

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

2008 · James N. Hilfiker, Neha Singh, et al. · Thin Solid Films · 311

Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

1998 · R.A Synowicki · Thin Solid Films · 283

Dielectric function representation by B‐splines

2008 · Blaine Johs, Jeffrey S. Hale · physica status solidi (a) · 266

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

1998 · B Johs, C.M Herzinger, et al. · Thin Solid Films · 263

Free-carrier and phonon properties ofn- andp-type hexagonal GaN films measured by infrared ellipsometry

2000 · A. Kasic, M. Schubert, et al. · Physical review. B, Condensed matter · 259

Understanding the intrinsic water wettability of graphite

2014 · Andrew Kozbial, Zhiting Li, et al. · Carbon · 233

Nature of the band gap and origin of the electro-/photo-activity of Co3O4

2013 · L. Qiao, H. Y. Xiao, et al. · Journal of Materials Chemistry C · 231

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

1999 · John A. Woollam, Blaine D. Johs, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 221

Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β -gallium oxide single crystals

2016 · M. Schubert, R. Korlacki, et al. · Physical review. B./Physical review. B · 214

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

1996 · Mathias Schubert, John A. Woollam, et al. · Journal of the Optical Society of America A · 178

VO2 nanophotonics

2020 · Sébastien Cueff, Jimmy John, et al. · APL Photonics · 166

Intrinsic Optical Properties and Enhanced Plasmonic Response of Epitaxial Silver

2014 · Yanwen Wu, Chengdong Zhang, et al. · Advanced Materials · 156

Optical properties of graphene oxide and reduced graphene oxide determined by spectroscopic ellipsometry

2017 · Stefan Schöche, Nina Hong, et al. · Applied Surface Science · 154

Universal Formation of Compositionally Graded Bulk Heterojunction for Efficiency Enhancement in Organic Photovoltaics

2014 · Zhengguo Xiao, Yongbo Yuan, et al. · Advanced Materials · 147

Natural optical activity as the origin of the large chiroptical properties in π-conjugated polymer thin films

2020 · Jessica Wade, James N. Hilfiker, et al. · Nature Communications · 145

Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films

1993 · William A. McGahan, Blaine Johs, et al. · Thin Solid Films · 126

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

2000 · Stefan Zollner, A. A. Demkov, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 123

Infrared switching electrochromic devices based on tungsten oxide

2000 · E. B. Franke, C. L. Trimble, et al. · Journal of Applied Physics · 122

InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry

1995 · C. M. Herzinger, P. G. Snyder, et al. · Journal of Applied Physics · 122

Deposition factors and band gap of zinc-blende AlN

2001 · Margarita P. Thompson, Gregory W. Auner, et al. · Journal of Applied Physics · 121

Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy

2015 · P. T. Webster, N. A. Riordan, et al. · Journal of Applied Physics · 105

Suppression of backside reflections from transparent substrates

2008 · R. A. Synowicki · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 105

Works count: 445

Citation count: 27,840