Keyword

atomic force microscope tip

Description: An atomic force microscope tip is the sharp probe attached to a cantilever, used to scan surfaces and measure nanoscale forces or properties.
OpenAlex ID: keywords/atomic-force-microscope-tip
2006 · Zhong Lin Wang, Jinhui Song · Science · 7,908
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2014 · Feng Lu, Mingzhou Jin, et al. · Nature Photonics · 343
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1994 · Hans W. P. Koops, Johannes Kretz, et al. · Japanese Journal of Applied Physics · 244
Works count: 1,340
Citation count: 50,510
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