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Keyword

charged device model

Description: An electrostatic-discharge testing model in which a charged electronic device discharges through a conductive path.
Wikidata ID: wiki/Q5074278
OpenAlex ID: keywords/charged-device-model
Very fast transmission line pulsing of integrated structures and the charged device model
1998 · Horst Gieser, Markus Haunschild · IEEE Transactions on Components Packaging and Manufacturing Technology Part C · 129
Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies
2005 · M.P.J. Mergens, C.C. Russ, et al. · IEEE Transactions on Device and Materials Reliability · 102
Very-fast transmission line pulsing of integrated structures and the charged device model
1996 · Gieser, Haunschild · Electrical Overstress/Electrostatic Discharge Symposium · 93
Distributed ESD protection for high-speed integrated circuits
2000 · B. Kleveland, T.J. Maloney, et al. · IEEE Electron Device Letters · 68
Characterization and modeling of transient device behavior under CDM ESD stress
2004 · J. Willemen, A. Andreini, et al. · Journal of Electrostatics · 54
Mechanisms of charged-device electrostatic discharges
1992 · Robert G. Renninger · Journal of Electrostatics · 53
From lightning to charged-device model electrostatic discharges
1993 · Don L. Lin, Terry L. Welsher · Journal of Electrostatics · 52
ESD in integrated circuits
1992 · Ajith Amerasekera, Jan Verwey · Quality and Reliability Engineering International · 44
Simulation of complete CMOS I/O circuit response to CDM stress
2002 · S.G. Beebe · Electrical Overstress/Electrostatic Discharge Symposium · 40
Advanced CMOS protection device trigger mechanisms during CDM
1995 · C. Duvvury, A. Amerasekera · Electrical Overstress/Electrostatic Discharge Symposium · 40
Cancellation technique to provide ESD protection for multi-GHz RF inputs
2003 · S. Hyvonen, S. Joshi, et al. · Electronics Letters · 39
Chip-level charged-device modeling and simulation in CMOS integrated circuits
2003 · Jaesik Lee, Ki-Wook Kim, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 37
Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits
2010 · Vrashank Shukla, Nathan Jack, et al. · IEEE International Reliability Physics Symposium proceedings · 36
Integrated circuit metal in the charged device model: bootstrap heating, melt damage, and scaling laws
1993 · Timothy J. Maloney · Journal of Electrostatics · 36
Influence of tester, test method, and device type on CDM ESD testing
1995 · K. Verhaege, G.V. Groeseneken, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 34
CDM ESD current characterization — Package variability effects and comparison to die-level CDM
2009 · Alan Righter, Javier A. Salcedo, et al. · 33
ESD Design Strategies for High-Speed Digital and RF Circuits in Deeply Scaled Silicon Technologies
2010 · Shuqing Cao, Jung-Hoon Chun, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 32
SCR Device Fabricated With Dummy-Gate Structure to Improve Turn-On Speed for Effective ESD Protection in CMOS Technology
2005 · M.-D. Ker, K.-C. Hsu · IEEE Transactions on Semiconductor Manufacturing · 32
Design and Characterization of ESD Protection Devices for High-Speed I/O in Advanced SOI Technology
2010 · Shuqing Cao, Akram A. Salman, et al. · IEEE Transactions on Electron Devices · 31
Gate-Controlled LVTSCR for High-Voltage ESD Protections in Advanced CMOS Processes
2023 · Ruibo Chen, Hongxia Liu, et al. · IEEE Transactions on Electron Devices · 29
Fast turn-on of an NMOS ESD protection transistor: measurements and simulations
1995 · J.R.M. Luchies, C.G.C.M. de Kort, et al. · Journal of Electrostatics · 29
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Programmable On-Chip ESD Protection Using Nanocrystal Dots Mechanism and Structures
2012 · Zitao Shi, Xin Wang, et al. · IEEE Transactions on Nanotechnology · 28
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS
2011 · Jian Liu, Xin Wang, et al. · IEEE Journal of Solid-State Circuits · 28
A CDM‐only reproducible field degradation and its reliability aspect
1994 · H. A. Gieser, P. Egger, et al. · Quality and Reliability Engineering International · 27
Post-Si Programmable ESD Protection Circuit Design: Mechanisms and Analysis
2013 · Xin Wang, Zitao Shi, et al. · IEEE Journal of Solid-State Circuits · 22
Works count: 332
Citation count: 2,495
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