Keyword

de-embedding

Description: De-embedding is a measurement technique that removes the electrical effects of fixtures, probes, or interconnects to estimate a device’s intrinsic properties.

Primary topic: Microwave and Dielectric Measurement Techniques (20%)

OpenAlex ID: keywords/de-embedding

An improved de-embedding technique for on-wafer high-frequency characterization

2002 · M.C.A.M. Koolen, J.A.M. Geelen, et al. · Bipolar Circuits and Technology Meeting, · 606

De-embedding transmission line measurements for accurate modeling of IC designs

2006 · A.M. Mangan, S.P. Voinigescu, et al. · IEEE Transactions on Electron Devices · 334

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Integrated Broadband Microwave and Microfluidic Sensor Dedicated to Bioengineering

2009 · K. Grenier, D. Dubuc, et al. · IEEE Transactions on Microwave Theory and Techniques · 278

Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures

2001 · E.P. Vandamme, D.M.M.-P. Schreurs, et al. · IEEE Transactions on Electron Devices · 258

Optimal Design of Wireless Power Transmission Links for Millimeter-Sized Biomedical Implants

2015 · Dukju Ahn, Maysam Ghovanloo · IEEE Transactions on Biomedical Circuits and Systems · 246

De-Embedding and Unterminating

1974 · R.F. Bauer, P. Penfield · IEEE Transactions on Microwave Theory and Techniques · 189

A four-step method for de-embedding gigahertz on-wafer CMOS measurements

2000 · T.E. Kolding · IEEE Transactions on Electron Devices · 182

Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration

1988 · H.-J. Eul, B. Schiek · European Microwave Conference (EuMC) · 173

Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz

1999 · S.H.-M. Jen, C.C. Enz, et al. · IEEE Transactions on Electron Devices · 157

Radio Frequency Transistors and Circuits Based on CVD MoS2

2015 · Atresh Sanne, Rudresh Ghosh, et al. · Nano Letters · 156

Circuit Modeling of Injection Probes for Bulk Current Injection

2007 · Flavia Grassi, Filippo Marliani, et al. · IEEE Transactions on Electromagnetic Compatibility · 153

Microwave Circuit Modeling Using Electromagnetic Field Simulation

2003 · D.G. Swanson, W.J.R. Hoefer · Thammasat University Digital Collections · 137

Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives

2005 · L.F. Tiemeijer, R.J. Havens, et al. · IEEE Transactions on Microwave Theory and Techniques · 131

Interposer design optimization for high frequency signal transmission in passive and active interposer using through silicon via (TSV)

2011 · Namhoon Kim, Daniel Wu, et al. · 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) · 122

A general noise and S-parameter deembedding procedure for on-wafer high-frequency noise measurements of MOSFETs

2001 · C.-H. Chen, M.J. Deen · IEEE Transactions on Microwave Theory and Techniques · 122

A joint field/circuit model of line-to-ring coupling structures and its application to the design of microstrip dual-mode filters and ring resonator circuits

1999 · Lei Zhu, Ke Wu · IEEE Transactions on Microwave Theory and Techniques · 117

200 GHz Maximum Oscillation Frequency in CVD Graphene Radio Frequency Transistors

2016 · Yun Wu, Xuming Zou, et al. · ACS Applied Materials & Interfaces · 115

High-Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues

2006 · M.J. Deen, C.-H. Chen, et al. · IEEE Transactions on Electron Devices · 113

Modeling and Design of Electromagnetic Compatibility for High-Speed Printed Circuit Boards and Packaging

2017 · Xing-Chang Wei · CRC Press eBooks · 110

Permittivity and Loss Tangent Characterization for Garment Antennas Based on a New Matrix-Pencil Two-Line Method

2008 · Frederick Declercq, Hendrik Rogier, et al. · IEEE Transactions on Antennas and Propagation · 109

An Analytical Approach to Computer-Aided Diagnosis and Tuning of Lossy Microwave Coupled Resonator Filters

2009 · Meng Meng, Ke-Li Wu · IEEE Transactions on Microwave Theory and Techniques · 108

Bias dependence of the MODFET intrinsic model elements values at microwave frequencies

1989 · B. Hughes, P.J. Tasker · IEEE Transactions on Electron Devices · 107

High frequency noise of MOSFETs I Modeling

1998 · C.H. Chen, M.J. Deen · Solid-State Electronics · 106

Characterization and Analysis of On-Chip Microwave Passive Components at Cryogenic Temperatures

2020 · Bishnu Patra, Mohammadreza Mehrpoo, et al. · IEEE Journal of the Electron Devices Society · 105

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Guided-wave characteristics of periodic coplanar waveguides with inductive loading~unit-length transmission parameters

2003 · Lei Zhu · IEEE Transactions on Microwave Theory and Techniques · 104

Works count: 1,919

Citation count: 16,150