Keyword

deep levels

Description: Electronic defect states located deep within a semiconductor’s band gap, studied for their effects on carrier behavior and device performance.
Wikidata ID: wiki/Q5250052
OpenAlex ID: keywords/deep-level-defects
2017 · Woon Seok Yang, Byung-Wook Park, et al. · Science · 5,447
2021 · Hanul Min, Do Yoon Lee, et al. · Nature · 3,176
1977 · C. H. Henry, D. V. Lang · Physical review. B, Solid state · 1,209
2004 · S. Seo, M. J. Lee, et al. · Applied Physics Letters · 932
2015 · Bayrammurad Saparov, Feng Hong, et al. · Chemistry of Materials · 813
2010 · Shiyou Chen, Ji-Hui Yang, et al. · Physical Review B · 740
1980 · G. J. Rees · Birkhäuser Boston eBooks · 731
1978 · Sokrates T. Pantelides · Reviews of Modern Physics · 691
1983 · Jacques Bourgoin, Michel Lannoo · Springer series in solid-state sciences · 635
2018 · Xixing Wen, Chao Chen, et al. · Nature Communications · 582
2014 · Michael L. Agiorgousis, Yi-Yang Sun, et al. · Journal of the American Chemical Society · 564
1994 · Lorenzo Pavesi, Mario Guzzi · Journal of Applied Physics · 496
2012 · Julien Vidal, Stephan Lany, et al. · Applied Physics Letters · 479
2006 · M. Skowronski, S. Ha · Journal of Applied Physics · 474
1981 · A. Chantre, G. Vincent, et al. · Physical review. B, Condensed matter · 461
2009 · O. Lupan, V.V. Ursaki, et al. · Sensors and Actuators B Chemical · 458
2018 · Yu Xiao, Li-Dong Zhao · npj Quantum Materials · 424
1991 · J. I. Pánkové, N. M. Johnson, et al. · 385
2012 · Michael J. Uren, Janina Moreke, et al. · IEEE Transactions on Electron Devices · 355
1989 · David W. Jenkins, John D. Dow · Physical review. B, Condensed matter · 352
Works count: 12,460
Citation count: 183,300
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