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electrostatic discharge testing

Description: Testing methods evaluate the effects of electrostatic discharge on electronic components and systems for reliability and electromagnetic compatibility.
OpenAlex ID: keywords/electrostatic-discharge-testing
8th Spacecraft Charging Technology Conference
2004 · Jody Minor · NASA Technical Reports Server (NASA) · 93
Correlation Between EUT Failure Levels and ESD Generator Parameters
2008 · Jayong Koo, Qing Cai, et al. · IEEE Transactions on Electromagnetic Compatibility · 49
Electrostatic Discharge Testing of Multijunction Solar Array Coupons After Combined Space Environmental Exposures
2011 · Kenneth H. Wright, Todd A. Schneider, et al. · IEEE Transactions on Plasma Science · 39
Some fundamental aspects of ESD testing
2002 · R.K. Keenan, L.A. Rosi · 29
Delivering IEC 61000-4-2 current pulses through transmission lines at 100 and 330 ohm system impedances
2008 · Evan Grund, Kathleen Muhonen, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 22
Analysis of HBM ESD testers and specifications using a fourth‐order lumped element model
1994 · Koen Verhaege, Philippe J. Roussel, et al. · Quality and Reliability Engineering International · 19
Dependability Benchmarking Using Environmental Test Tools
2008 · Cristian Constantinescu · 17
Dependability benchmarking using environmental test tools
2005 · C. Constantinescu · Proceedings, annual Reliability and Maintainability Symposium/Proceedings. Annual Reliability and Maintainability Symposium · 17
Dependence of ESD Charge Voltage on Humidity in Data Centers: Part I - Test Methods
2015 · Atieh Talebzadeh, Mahdi Moradian, et al. · ASHRAE winter conference papers · 16
Proposal of a Current Regulative Diode for Power Supply in Sustained Arc Test
2006 · K. Toyoda, S. Aso, et al. · IEEE Transactions on Plasma Science · 16
Gate oxide failures due to anomalous stress from HBM ESD testers
2005 · Charvaka Duvvury, Robert Steinhoff, et al. · Microelectronics Reliability · 16
Transmission line pulsed waveform shaping with microwave filters
2003 · S. Joshi, Elyse Rosenbaum · Electrical Overstress/Electrostatic Discharge Symposium · 15
Wafer-level Charged Device Model testing
2008 · B.C.S. Chou, Timothy J. Maloney, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 14
Gate oxide failures due to anomalous stress from HBM ESD testers
2004 · Charvaka Duvvury, Robert Steinhoff, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 14
A Standard Test To Determine the Susceptibility of a Machine to Electrostatic Discharge
1986 · Ralph J. Calcavecchio, Daniel J. Pratt · 14
Electrostatic discharge test with simulated coverglass flashover for multi-junction GaAs/Ge solar array design
2010 · Bao Hoang, Frankie Wong, et al. · Conference record of the IEEE Photovoltaic Specialists Conference · 12
Different CDM ESD Simulators provide different failure thresholds from the same device even though all the simulators meet the CDM standard specifications
2006 · L. Henry, Ravindra Narayan, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
Charged device model (CDM) metrology: limitations and problems
2005 · L.G. Henry, H. Hyatt, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
Study of radiation induced conductivity and photoconduction phenomenon for materials used in space environment
2016 · M. Arnaout, T. Paulmier, et al. · Journal of Electrostatics · 10
Prediction of Charged Device Model Peak Discharge Current for Microelectronic Components
2014 · Vrashank Shukla, Gianluca Boselli, et al. · IEEE Transactions on Device and Materials Reliability · 10
HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform
2012 · Kathleen Muhonen, R.A. Ashton, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 10
Experience in HBM ESD testing of high pin count devices
2006 · Tilo Brodbeck, Reinhold Gaertner · Microelectronics Reliability · 9
Diagnostic effectiveness in computer systems using deterministic random ESD
2002 · H.H. Nick, B.E. Osborn, et al. · IEEE International Symposium on Electromagnetic Compatibility · 9
Stochastic modeling of air electrostatic discharge parameters
2018 · Yang Xiu, Samuel Sagan, et al. · IEEE International Reliability Physics Symposium proceedings · 8
The Influence of Electrostatic Charge on the Stability of Electronic and Electrical Equipment
2017 · A. A. Vorshevskii, E. S. Grishakov · Russian Electrical Engineering · 8
Works count: 281
Citation count: 793
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