Keyword

ellipsometry

Description: An optical measurement technique that analyzes changes in polarized light reflected from surfaces to characterize thin films and material properties.
Wikidata ID: wiki/Q898774
OpenAlex ID: keywords/ellipsometry
1985 · Elsevier eBooks · 20,922
1978 · R. M. A. Azzam, N. M. Bashara, et al. · Physics Today · 4,278
1978 · L.J. Cox · Optica Acta International Journal of Optics · 1,897
1987 · R.M.A. Azzam, N.M. Bashara, et al. · Analytica Chimica Acta · 1,764
1987 · P.G. de Gennes · Advances in Colloid and Interface Science · 1,681
2005 · Springer eBooks · 1,414
1978 · J.P.G. Farr · Surface Technology · 1,113
1986 · D. E. Aspnes, S. M. Kelso, et al. · Journal of Applied Physics · 889
2010 · Aaron M. Jubb, Heather C. Allen · ACS Applied Materials & Interfaces · 862
2005 · A. B. Kuzmenko · Review of Scientific Instruments · 858
1986 · J. D. Andrade, V. Hlady · Advances in polymer science · 813
1984 · L. Viña, S. Logothetidis, et al. · Physical review. B, Condensed matter · 793
1978 · S. R. Morrison, Peder J. Estrup · Physics Today · 708
1973 · H. Angerstein-Kozlowska, B.E. Conway, et al. · Journal of Electroanalytical Chemistry · 685
2003 · R. Atkin, V.S.J. Craig, et al. · Advances in Colloid and Interface Science · 653
2006 · Daeyeon Lee, Michael F. Rubner, et al. · Nano Letters · 631
1963 · Frank L. McCrackin, Elio Passaglia, et al. · Journal of Research of the National Bureau of Standards Section A Physics and Chemistry · 616
1994 · C. Jeffrey Brinker, Alan J. Hurd · Journal de Physique III · 552
2011 · A. Shalabney, I. Abdulhalim · Laser & Photonics Review · 551
1993 · Tompkins, Harland G. 1938- · Elsevier eBooks · 524
Works count: 8,281
Citation count: 156,700
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