Keyword

memory reliability

Description: The accuracy and consistency of remembered information, or the dependability of computer memory hardware, depending on context.
OpenAlex ID: keywords/memory-reliability
2010 · H.-S. Philip Wong, Simone Raoux, et al. · Proceedings of the IEEE · 1,824
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2014 · Yoongu Kim, Ross Daly, et al. · ACM SIGARCH Computer Architecture News · 922
2005 · R. Baumann · IEEE Design & Test of Computers · 831
1984 · Gary L. Wells, Elizabeth F. Loftus · Cambridge University Press eBooks · 590
1984 · C. L. Chen, M. Y. Hsiao · IBM Journal of Research and Development · 546
2014 · Yoongu Kim, Ross Daly, et al. · ACM/IEEE International Symposium on Computer Architecture (ISCA) · 465
2008 · Neal Mielke, Todd Marquart, et al. · IEEE International Reliability Physics Symposium proceedings · 367
2009 · Ugo Russo, Daniele Ielmini, et al. · IEEE Transactions on Electron Devices · 361
1999 · Paulo Cappelletti, Carla Golla, et al. · Springer eBooks · 350
1998 · Daniel P. Brown, Alan W. Scheflin, et al. · Medical Entomology and Zoology · 297
1997 · Barbara Maughan, Michael Rutter · Journal of Personality Disorders · 291
2003 · Elizabeth Loftus · Nature reviews. Neuroscience · 286
2019 · Yang Yu, Qihao Ma, et al. · Advanced Functional Materials · 285
1991 · American Psychological Association eBooks · 274
2017 · Christian Monzio Compagnoni, Akira Goda, et al. · Proceedings of the IEEE · 272
2015 · Carsten Kutzner, Szilárd Páll, et al. · Journal of Computational Chemistry · 269
2013 · Onur Mutlu · IEEE International Memory Workshop (IMW) · 259
2012 · W.S. Zhao, Y. Zhang, et al. · Microelectronics Reliability · 254
2004 · J. Maiz, S. Hareland, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 250
2010 · Aniruddha N. Udipi, Naveen Muralimanohar, et al. · Proceedings - International Symposium on Computer Architecture/Proceedings · 242
2013 · Lawrence Patihis, Lavina Y. Ho, et al. · Psychological Science · 238
2019 · Onur Mutlu, Jeremie S. Kim · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 230
2015 · Moinuddin K. Qureshi, Dae-Hyun Kim, et al. · IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) · 219
Works count: 4,814
Citation count: 50,680
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