Keyword

memory window

Description: The voltage range separating distinct resistance or polarization states in a nonvolatile memory device, indicating its readout margin.
OpenAlex ID: keywords/memory-window
2019 · Mengwei Si, Atanu K. Saha, et al. · Nature Electronics · 652
2017 · S. Dunkel, M. Trentzsch, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 540
2018 · Kai Ni, Pankaj Sharma, et al. · IEEE Transactions on Electron Devices · 450
2014 · Enze Zhang, Weiyi Wang, et al. · ACS Nano · 288
2012 · J. Muller, E. Yurchuk, et al. · Symposium on VLSI Technology · 288
2008 · Kang‐Jun Baeg, Yong‐Young Noh, et al. · Advanced Functional Materials · 284
2007 · Jang-Sik Lee, Jang-Sik Lee, et al. · Nature Nanotechnology · 265
2010 · H. Y. Lee, Y. S. Chen, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 264
2013 · Semiconductor Science and Technology · 263
2011 · Augustin J. Hong, Emil B. Song, et al. · ACS Nano · 255
2018 · Kai Ni, Matthew Jerry, et al. · IEEE Symposium on VLSI Technology · 251
1999 · M. Joseph, H. Tabata, et al. · Applied Physics Letters · 216
2021 · Ava Jiang Tan, Yu-Hung Liao, et al. · IEEE Electron Device Letters · 204
2018 · Yi Ren, Jia‐Qin Yang, et al. · Advanced Functional Materials · 203
2015 · Daniele Garbin, Elisa Vianello, et al. · IEEE Transactions on Electron Devices · 202
2005 · Chungho Lee, Jami Meteer, et al. · Journal of Electronic Materials · 195
2015 · Chien‐Chung Shih, Yu‐Cheng Chiu, et al. · Advanced Functional Materials · 164
2014 · Ekaterina Yurchuk, Johannes Muller, et al. · IEEE Transactions on Electron Devices · 163
2018 · K. Florent, M. Pesic, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 162
2019 · Halid Mulaosmanovic, Evelyn T. Breyer, et al. · IEEE Transactions on Electron Devices · 161
Works count: 3,077
Citation count: 44,760
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