Keyword

process variation

Description: Unintended differences in manufacturing conditions that cause variations in semiconductor device and circuit characteristics.

Primary topic: Low-power high-performance VLSI design (26%)

Wikidata ID: wiki/Q7247313

OpenAlex ID: keywords/process-variation

Principal Component Analysis

2001 · Leo H. Chiang, Evan L. Russell, et al. · Advanced textbooks in control and signal processing · 6,594

Digital integrated circuits : a design perspective

1996 · Jan M. Rabaey, Anantha P. Chandrakasan, et al. · CERN Document Server (European Organization for Nuclear Research) · 2,152

Parameter variations and impact on circuits and microarchitecture

2003 · Shekhar Borkar, Tanay Karnik, et al. · Proceedings - ACM IEEE Design Automation Conference · 1,416

Methods for growth of cultured cells in serum-free medium

1980 · David Barnes, Gordon Sato · Analytical Biochemistry · 1,002

New Generation of Predictive Technology Model for Sub-45 nm Early Design Exploration

2006 · W. Zhao, Y. Cao · IEEE Transactions on Electron Devices · 853

Design of High-Performance Microprocessor Circuits

2000 · Anantha Chandrakasan, William J. Bowhill, et al. · Institute of Electrical and Electronics Engineers eBooks · 794

A New Measure of Process Capability:Cpm

1988 · Lai K. Chan, Smiley W. Cheng, et al. · Journal of Quality Technology · 768

Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration

2002 · K.A. Bowman, S.G. Duvall, et al. · IEEE Journal of Solid-State Circuits · 743

Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

2002 · J.W. Tschanz, J.T. Kao, et al. · IEEE Journal of Solid-State Circuits · 739

An Analysis for Unreplicated Fractional Factorials

1986 · George E.P. Box, R. Daniel Meyer · Technometrics · 577

High-performance CMOS variability in the 65-nm regime and beyond

2006 · K. Bernstein, D. J. Frank, et al. · IBM Journal of Research and Development · 561

Optimal design of a CMOS op-amp via geometric programming

2001 · M.delM. Hershenson, S.P. Boyd, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 550

The Art of Analog Layout

2000 · A. E. Hastings · 538

Process Variation Tolerant 3T1D-Based Cache Architectures

2007 · Xiaoyao Liang, Ramon Canal, et al. · Proceedings of the ... annual International Symposium on Microarchitecture/Proceedings of the annual International Symposium on Microarchitecture · 505

In-process sensing in selective laser melting (SLM) additive manufacturing

2016 · Thomas G. Spears, Scott A. Gold · Integrating materials and manufacturing innovation · 495

New Generation of Predictive Technology Model for Sub-45nm Design Exploration

2006 · Wei Zhao, Yu Cao · International Symposium on Quality Electronic Design (ISQED) · 474

Review of: "FinFET nanotransistor, the reduction of scale causes more short channel effects, less gate control, an exponential increase in leakage currents, severe process changes, and power densities"

2024 · Chad Allen · Qeios · 462

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Modeling and analysis of manufacturing variations

2002 · S.R. Nassif · IEEE Custom Integrated Circuits Conference (CICC) · 431

VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects

2008 · Smruti R. Sarangi, Brian Greskamp, et al. · IEEE Transactions on Semiconductor Manufacturing · 419

Reducing clinical variations with clinical pathways: do pathways work?

2003 · M. Panella · International Journal for Quality in Health Care · 419

Memristor Crossbar-Based Neuromorphic Computing System: A Case Study

2014 · Miao Hu, Hai Li, et al. · IEEE Transactions on Neural Networks and Learning Systems · 414

Lean Six Sigma : combining Six Sigma quality with lean speed

2002 · Michael L. George · 410

RF-CMOS oscillators with switched tuning

2002 · A. Kral, F. Behbahani, et al. · IEEE Custom Integrated Circuits Conference (CICC) · 407

The Toyota Product Development System

2018 · James Morgan, Jeffrey K. Liker · Productivity Press eBooks · 385

Process Technology Variation

2011 · Kelin J. Kuhn, Martin D. Giles, et al. · IEEE Transactions on Electron Devices · 373

Works count: 20,440

Citation count: 212,900