Keyword

soft error rate

Description: Soft error rate is the frequency of transient, non-destructive errors in electronic devices, particularly semiconductor memories and circuits.

Primary topic: Radiation Effects in Electronics (85%)

OpenAlex ID: keywords/soft-error-rate

Modeling the effect of technology trends on the soft error rate of combinational logic

2003 · P. Shivakumar, M. Kistler, et al. · IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) · 1,454

Terrestrial cosmic rays

1996 · J. F. Ziegler · IBM Journal of Research and Development · 559

Characterization of soft errors caused by single event upsets in CMOS processes

2004 · T. Karnik, P. Hazucha · IEEE Transactions on Dependable and Secure Computing · 546

Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

2010 · Eishi Ibe, Hitoshi Taniguchi, et al. · IEEE Transactions on Electron Devices · 506

The Soft Error Problem: An Architectural Perspective

2005 · S.S. Mukherjee, J. Emer, et al. · Proceedings - International Symposium on High-Performance Computer Architecture/Proceedings · 445

Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground

2004 · M.S. Gordon, P. Goldhagen, et al. · IEEE Transactions on Nuclear Science · 392

The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

2003 · R. Baumann · 320

The impact of new technology on soft error rates

2011 · Anand Dixit, Alan Wood · IEEE International Reliability Physics Symposium proceedings · 304

A Soft Error Tolerant 10T SRAM Bit-Cell With Differential Read Capability

2009 · Shah M. Jahinuzzaman, David J. Rennie, et al. · IEEE Transactions on Nuclear Science · 292

Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

2004 · Christopher Weaver, Joel Emer, et al. · ACM SIGARCH Computer Architecture News · 256

Design and reliability challenges in nanometer technologies

2004 · Shekhar Borkar, Tanay Karnik, et al. · Proceedings - ACM IEEE Design Automation Conference · 236

Sequential Element Design With Built-In Soft Error Resilience

2006 · Ming Zhang, Subhasish Mitra, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 214

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

2006 · N. Seifert, P. Slankard, et al. · IEEE International Reliability Physics Symposium proceedings · 213

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

2012 · N. Seifert, B. Gill, et al. · IEEE Transactions on Nuclear Science · 192

Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

2008 · D. Munteanu, J.-L. Autran · IEEE Transactions on Nuclear Science · 187

Computing Architectural Vulnerability Factors for Address-Based Structures

2005 · Arijit Biswas, Paul Racunas, et al. · ACM SIGARCH Computer Architecture News · 186

Switching Distributions for Perpendicular Spin-Torque Devices Within the Macrospin Approximation

2012 · W. H. Butler, T. Mewes, et al. · IEEE Transactions on Magnetics · 177

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Analytical Functions to Predict Cosmic-Ray Neutron Spectra in the Atmosphere

2006 · Tatsuhiko Sato, Koji Niita · Radiation Research · 171

Field testing for cosmic ray soft errors in semiconductor memories

1996 · T. J. O'Gorman, J. M. Ross, et al. · IBM Journal of Research and Development · 168

Impact of scaling on soft-error rates in commercial microprocessors

2002 · N. Seifert, Xiaowei Zhu, et al. · IEEE Transactions on Nuclear Science · 166

A soft error rate analysis (SERA) methodology

2005 · Ming Zhang, N.R. Shanbhag · 160

Computing Architectural Vulnerability Factors for Address-Based Structures

2005 · A. Biswas, P. Racunas, et al. · Proceedings - International Symposium on Computer Architecture/Proceedings · 155

Soft-Error-Rate-Analysis (SERA) Methodology

2006 · M. Zhang, N.R. Shanbhag · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 150

Critical charge calculations for a bipolar SRAM array

1996 · L. B. Freeman · IBM Journal of Research and Development · 150

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

2011 · N. N. Mahatme, S. Jagannathan, et al. · IEEE Transactions on Nuclear Science · 149

Works count: 1,319

Citation count: 24,550