Keyword

soft errors

Description: Transient faults in electronic systems that alter stored data or signals without permanently damaging the underlying hardware.

Primary topic: Radiation Effects in Electronics (69%)

Wikidata ID: wiki/Q1658917

OpenAlex ID: keywords/soft-errors

Error Detecting and Error Correcting Codes

2014 · Neha Chauhan, Pooja Yadav, et al. · 3,202

Radiation-induced soft errors in advanced semiconductor technologies

2005 · R.C. Baumann · IEEE Transactions on Device and Materials Reliability · 1,539

Soft Errors in Advanced Computer Systems

2005 · R. Baumann · IEEE Design & Test of Computers · 831

SWIFT: Software Implemented Fault Tolerance

2005 · G.A. Reis, J. Chang, et al. · International Symposium on Code Generation and Optimization (CGO) · 730

Understanding error propagation in deep learning neural network (DNN) accelerators and applications

2017 · Guanpeng Li, Siva Kumar Sastry Hari, et al. · 2012 International Conference for High Performance Computing, Networking, Storage and Analysis · 585

Robust system design with built-in soft-error resilience

2005 · S. Mitra, N. Seifert, et al. · Computer · 562

Terrestrial cosmic rays

1996 · J. F. Ziegler · IBM Journal of Research and Development · 559

Characterization of soft errors caused by single event upsets in CMOS processes

2004 · T. Karnik, P. Hazucha · IEEE Transactions on Dependable and Secure Computing · 546

Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review

1984 · C. L. Chen, M. Y. Hsiao · IBM Journal of Research and Development · 546

IBM experiments in soft fails in computer electronics (1978–1994)

1996 · J. F. Ziegler, H. W. Curtis, et al. · IBM Journal of Research and Development · 460

The Soft Error Problem: An Architectural Perspective

2005 · S.S. Mukherjee, J. Emer, et al. · Proceedings - International Symposium on High-Performance Computer Architecture/Proceedings · 445

An Architecture for Fault-Tolerant Computation with Stochastic Logic

2010 · Weikang Qian, Xin Li, et al. · IEEE Transactions on Computers · 418

Single Event Transients in Digital CMOS—A Review

2013 · V. Ferlet-Cavrois, L. W. Massengill, et al. · IEEE Transactions on Nuclear Science · 417

Statistical fault injection: Quantified error and confidence

2009 · R. Leveugle, A. Calvez, et al. · Design, Automation, and Test in Europe · 415

Soft errors in advanced semiconductor devices-part I: the three radiation sources

2001 · R.C. Baumann · IEEE Transactions on Device and Materials Reliability · 414

Architecture Design for Soft Errors

2008 · Elsevier eBooks · 369

Measurement and reporting of alpha particle and terrestrial cosmic ray induced soft errors in semiconductor devices

2001 · Jedec · Medical Entomology and Zoology · 349

Gate sizing to radiation harden combinational logic

2005 · Quming Zhou, K. Mohanram · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 345

The effects of energy management on reliability in real-time embedded systems

2005 · Dakai Zhu, R. Melhem, et al. · 328

Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices

2005 · S. Krishnaswamy, G.F. Viamontes, et al. · Design, Automation, and Test in Europe · 279

Cost-effective approach for reducing soft error failure rate in logic circuits

2004 · K. Mohanram, N.A. Touba · 273

Failure and reliability analysis of STT-MRAM

2012 · W.S. Zhao, Y. Zhang, et al. · Microelectronics Reliability · 254

Soft Errors in Modern Electronic Systems

2010 · Nicolaidis, M. · Frontiers in electronic testing · 249

Cosmic rays don't strike twice

2012 · Andy A. Hwang, Ioan A. Stefanovici, et al. · 242

Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding

2007 · Jangwoo Kim, Nikos Hardavellas, et al. · 241

Works count: 4,992

Citation count: 62,080