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trigger voltage
Description:
The voltage threshold at which an electrical device or circuit switches state or begins conducting.
Primary topic:
Electrostatic Discharge in Electronics (72%)
Related topics:
Electrostatic Discharge in Electronics (72%),
Pulsed Power Technology Applications (15%)
OpenAlex ID:
keywords/trigger-voltage
An Improved Bidirectional SCR Structure for Low-Triggering ESD Protection Applications
2008
·
Zhiwei Liu
, J. Vinson
, et al.
·
IEEE Electron Device Letters
·
67
High Holding Voltage SCR-LDMOS Stacking Structure With Ring-Resistance-Triggered Technique
2013
·
Fei Ma
, Bin Zhang
, et al.
·
IEEE Electron Device Letters
·
61
Breakdown mechanisms and electrical properties of triggered vacuum gaps
1976
·
G. R. Govinda Raju
, R. Hackam
, et al.
·
Journal of Applied Physics
·
60
Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage
2002
·
V. De Heyn
, G. Groeseneken
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
52
A New SCR Structure With High Holding Voltage and Low ON-Resistance for 5-V Applications
2020
·
Kyoung-Il Do
, Yong-Seo Koo
·
IEEE Transactions on Electron Devices
·
48
Design of a Gate Diode Triggered SCR for Dual-Direction High-Voltage ESD Protection
2018
·
Hailian Liang
, Qiang Xu
, et al.
·
IEEE Electron Device Letters
·
47
Silicon-Controlled Rectifier for Electrostatic Discharge Protection Solutions With Minimal Snapback and Reduced Overshoot Voltage
2015
·
Ruei-Cheng Sun
, Zhixin Wang
, et al.
·
IEEE Electron Device Letters
·
44
Plasma Buildup and Breakdown Delay in a Triggered Vacuum Gap
1979
·
A. J. Green
, C. Christopoulos
·
IEEE Transactions on Plasma Science
·
43
Novel Capacitance Coupling Complementary Dual-Direction SCR for High-Voltage ESD
2012
·
Shurong Dong
, Hao Jin
, et al.
·
IEEE Electron Device Letters
·
41
Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies
2007
·
James Di Sarro
, Kiran Chatty
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
41
Reliability of three-electrode spark gaps
2008
·
P. Osmokrović
, N. Arsić
, et al.
·
Plasma devices and operations
·
38
RC-Embedded LDMOS-SCR With High Holding Current for High-Voltage I/O ESD Protection
2015
·
Hailian Liang
, Xiaofeng Gu
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
34
The influence of polarity on trigatron switching performance
1997
·
S.J. MacGregor
, F.A. Tuema
, et al.
·
IEEE Transactions on Plasma Science
·
33
Investigation of a multichanneling, multigap Marx bank switch
2003
·
K. R. LeChien
, J. M. Gahl
·
Review of Scientific Instruments
·
32
Implementation of Initial-On ESD Protection Concept With PMOS-Triggered SCR Devices in Deep-Submicron CMOS Technology
2007
·
Ming-Dou Ker
, Shih-Hung Chen
·
IEEE Journal of Solid-State Circuits
·
30
Novel diode-chain triggering SCR circuits for ESD protection
2000
·
Sheng-Lyang Jang
, Ming-Shung Gau
, et al.
·
Solid-State Electronics
·
30
Lateral SCR devices with low-voltage high-current triggering characteristics for output ESD protection in submicron CMOS technology
1998
·
Ming-Dou Ker
·
IEEE Transactions on Electron Devices
·
30
Gate-Controlled LVTSCR for High-Voltage ESD Protections in Advanced CMOS Processes
2023
·
Ruibo Chen
, Hongxia Liu
, et al.
·
IEEE Transactions on Electron Devices
·
29
A High Failure-Current Gate-Controlled Dual-Direction SCR for High-Voltage ESD Protection in 0.18-μm BCD Technology
2019
·
Yang Wang
, Xiangliang Jin
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
29
Design and layout of a high ESD performance NPN structure for submicron BiCMOS/bipolar circuits
1996
·
J.Z. Chen
, Xin Yi Zhang
, et al.
·
29
Fast turn-on of an NMOS ESD protection transistor: measurements and simulations
1995
·
J.R.M. Luchies
, C.G.C.M. de Kort
, et al.
·
Journal of Electrostatics
·
29
PDF
Low-power and low-offset comparator using latch load
2011
·
Y. Jung
, S. Lee
, et al.
·
Electronics Letters
·
27
Engineering the cascoded NMOS output buffer for maximum V/sub t1/
2002
·
J.W. Miller
, M.G. Khazhinsky
, et al.
·
Electrical Overstress/Electrostatic Discharge Symposium
·
26
An Enhanced MLSCR Structure Suitable for ESD Protection in Advanced Epitaxial CMOS Technology
2019
·
Feibo Du
, Fei Hou
, et al.
·
IEEE Transactions on Electron Devices
·
25
New Diode-Triggered Silicon-Controlled Rectifier for Robust Electrostatic Discharge Protection at High Temperatures
2019
·
Fei Hou
, Jizhi Liu
, et al.
·
IEEE Transactions on Electron Devices
·
24
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Works count:
432
Citation count:
2,483
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