Keyword

X-ray diffractometer

Description: A scientific instrument that measures X-ray diffraction patterns to determine structural properties of crystalline materials.
Wikidata ID: wiki/Q904573
OpenAlex ID: keywords/x-ray-diffractometer
1994 · L. W. Finger, D. E. Cox, et al. · Journal of Applied Crystallography · 1,244
1975 · F. W. Lytle, D. E. Sayers, et al. · Physical review. B, Solid state · 559
1967 · W. R. Busing, H. A. Levy · Acta Crystallographica · 459
2008 · Willie Harris, G. Norman White · Soil Science Society of America book series · 178
1994 · Wiley eBooks · 89
1999 · H. You · Journal of Applied Crystallography · 77
2002 · Masamitu Takahasi, Yasuhiro Yoneda, et al. · Japanese Journal of Applied Physics · 63
1997 · Edwin M. Westbrook, Istvan Naday · Methods in enzymology on CD-ROM/Methods in enzymology · 63
2020 · David R. Black, Marcus H. Mendenhall, et al. · Powder Diffraction · 52
2006 · Y. Narumi, K. Kindo, et al. · Journal of Synchrotron Radiation · 43
1954 · P. Chiotti · Review of Scientific Instruments · 40
1970 · H. A. McKinstry · Journal of Applied Physics · 34
2005 · V. E. Asadchikov, V. G. Babak, et al. · Instruments and Experimental Techniques · 25
1980 · R. Kahn, R. Fourme, et al. · Nuclear Instruments and Methods · 23
1966 · M. D. Danford, A. H. Narten · Medical Entomology and Zoology · 23
1960 · G. Shirane, S.J. Pickart, et al. · Journal of Physics and Chemistry of Solids · 23
2005 · R. Guinebretière, A. Boulle, et al. · Powder Diffraction · 22
1984 · Stanley E. Sobottka, Gary G. Cornick, et al. · Nuclear Instruments and Methods in Physics Research · 22
1987 · S. E. G. Slusky, A. T. Macrander · Journal of Applied Crystallography · 19
2001 · V.K. Egorov, E.V. Egorov · Thin Solid Films · 18
2011 · Ichiko Misumi, Jun-ichiro Kitta, et al. · Measurement Science and Technology · 17
2005 · Olivier Masson, Alexandre Boulle, et al. · Review of Scientific Instruments · 17
Works count: 597
Citation count: 4,010
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