Electron and X-Ray Spectroscopy Techniques
Description: This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
Characteristic keywords: X-ray photoelectron spectroscopy, electron energy loss spectroscopy, surface analysis, Auger electron spectroscopy, secondary electron emission, electron probe microanalysis, energy-dispersive X-ray spectroscopy, photoelectron spectroscopy, X-ray microanalysis, electron energy loss, low-energy electron diffraction, secondary electron yield, inelastic electron scattering, electron spectroscopy, core-level spectra, backscattered electrons, ultraviolet photoelectron spectroscopy, inelastic mean free path, electron stimulated desorption, photoelectron diffraction, electron energy loss spectra, secondary electron imaging, core-level binding energies, surface structure determination, electron-solid interaction
Parent subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
OpenAlex ID: T12039