Year: 2001
Type: article
Abstract: Light Device Group, U niversit y of T wente P.O.Bo x 217, 7500 A E Enschede, N etherlands It is w ell know n that the conversion e£ciency of the SH G in the Ñ C erenko v regi me in a w aveguide w ith a nonlinear substrate exhibi ts a very sharp p eak.I ts p osition in a \pump w avelength {guide thickness " diagram follow s a mo di Ùed disp ersi on relation .A particular material combination exactly determines b oth the pump w avelength and the guide thickness.T he existence of the p eak was also exp erimentall y pro ved with relatively high normalis ed conversion e£ciency of 210%/ (cm W ). H ow ever, in order to achieve such a high conversion e£ciency , the required tolerance in the guide thickness should b e smaller than 0.5 nm (the FWH M of the peak is approximately 0.8 nm).T he allow ed v ariations in ref ractive indices are also very low (< 1 0 À 3 ).T he recent theoretical study of the authors show ed that an additiona l layer ( i d l e r ) inserted into the waveguide facilita tes more degrees of freedom w hich could relax the condition s for reaching the e£ciency peak.T his pap er presents a detailed study of the behaviou r of four-layer w aveguide devices w ith a nonlinear substrate which promise a less constrained w ay to reach the e£ciency p eak.
Source: Acta Physica Polonica A
Authors: L. Kotačka, J. Čtyroký, H.J.W.M. Hoekstra
Institutions: Czech Academy of Sciences, University of Twente
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W1005289101