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Development of Tomographic Scan Method for Industrial Plants
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Year:
2010
Type:
article
Source:
Journal of the Korean Society for Nondestructive Testing
Authors:
Jong Bum Kim,
Sung‐Hee Jung,
Jin Ho Moon,
Taek-Yong Kwon,
Gyuseong Cho
Language:
English
Topic:
Nuclear Physics and Applications
Subfield:
Radiation
Field:
Physics and Astronomy
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W1268532
FWCI:
Cites:
1
Cited by:
Related to:
10