In situ x-ray diffraction studies of a new LiMg{sub 0.125}Ni{sub 0.75}O{sub 2} cathode material
Year: 1999
Type: report
Abstract: A Synchrotron x-ray source was used for In Situ x-ray diffraction studies during charge on a new LiMg{sub 0.125}Ti{sub 0.125}Ni{sub 0.75} cathode material synthesized by FMC Corp. It had been demonstrated by Gao that this new material has superior thermal stability than LiNiO{sub 2} and LiCo{sub 0.2}Ni{sub 0.8}O{sub 2} at over-charged state. In this current paper, studies on the relationship between the structural changes and thermal stability at over-charged state for these materials are presented. For the first time, the thermal stability of these materials are related to their structural changes during charge, especially to the formation and lattice constant change of a hexagonal phase (H3). The spectral evidence support the hypothesis that the improvement of thermal stability is obtained by suppressing the formation of H3 phase and reducing the shrinkage of its lattice constant c when charged above 4.3 V.
DOI: 10.2172/355000
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W12878418