[SIMS (secondary ion mass spectroscopy) and XPS (x-ray photoelectron spectroscopy) study of titanium implant surfaces coated with anodic titanium-oxide layer].
Year: 2003
Type: article
Source: PubMed
Authors: Csongor Suba, Norbert Velich, György Vida, Lajos Kovács, Gábor Kiss, György Szabó
Institution: Semmelweis University
Language: Hungarian
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W129697384