Work

Exploring the Relationship between Item Exposure Rate and Test Overlap Rate in Computerized Adaptive Testing.

Year: 1999

Type: article

Authors: Shuying Chen, Robert D. Ankenmann, Judith A. Spray

Language: English

Topic: Psychometric Methodologies and Testing

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W133123262

FWCI: 5.366

Cites: 6

Cited by: 19

Related to: 10