Work

X-ray imaging using a 320/spl times/240 hybrid GaAs pixel detector

Year: 1999

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.775571

Authors: R. Irsigler, J. Andersson, J. Alverbro, J. Borglind, C. Frojdh, P. Helander, S. Manolopoulos, H. Martijn, V. O'Shea, K. Smith

Institution: University of Glasgow

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1490931469

FWCI: 4.275

Cites: 23

Cited by: 29

Related to: 10