Work

Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements

Year: 2012

Type: book-chapter

Abstract: Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements

Source: InTech eBooks

DOI: 10.5772/48431

Authors: Takuichi Hirano, Kenichi Okada, Jiro Hirokawa, Makoto Ando

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

Funder: University of Tokyo

OpenAlex ID: W1504825907

FWCI: 3.213

Cites: 15

Cited by: 13

Related to: 10