Work

Leakage mechanisms in BiFeO3 thin films

Year: 2007

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.2535663

Authors: Gary W. Pabst, Lane W. Martin, Ying-Hao Chu, R. Ramesh

Institutions: Lawrence Berkeley National Laboratory, University of California, Berkeley

Language: English

Topic: Multiferroics and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1505486839

FWCI: 17.81

Cites: 21

Cited by: 579

Related to: 10