Year: 2005
Type: report
Abstract: The authors present calculations of the expected temperature rise of proton beam profile monitors due to beam heating. The profile monitors are secondary emission monitors (SEM's) to be made of Titanium foils. The heating is studied to understand whether there is any loss of tension or alignment of such devices. Additionally, calculations of thermally-induced dynamic stress are presented. Ti foil is compared to other materials and also to wire SEM's. The calculations were initially performed for the NuMI beam, where the per-pulse intensity is quite high; for completeness the calculations are also performed for other beam energies and intensities.
DOI: 10.2172/15017051
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1522497072