Combined characterization techniques to understand the stability of a variety of organic photovoltaic devices: the ISOS-3 inter-laboratory collaboration
Year: 2012
Type: conference-paper
Abstract: This work is part of the inter-laboratory collaboration to study the stability of seven distinct sets of state-of-the-art organic photovoltaic (OPVs) devices prepared by leading research laboratories. All devices have been shipped to and degraded at the Danish Technical University (DTU, formerly RISO-DTU) up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. In this work we present a summary of the degradation response observed for the NREL sample, an inverted OPV of the type ITO/ZnO/P3HT:PCBM/PEDOT:PSS/Ag/Al, under full sun stability test. The results reported from the combination of the different characterization techniques results in a proposed degradation mechanism. The final conclusion is that the failure of the photovoltaic response of the device is mainly due to the degradation of the electrodes and not to the active materials of the solar cell.
DOI: 10.1117/12.929579
Authors: Monica Lira-Cantu, David M. Tanenbaum, Kion Norrman, Eszter Voroshazi, Martin Hermenau, Matthew T. Lloyd, Gerardo Teran-Escobar, Yulia Galagan, Birger Zimmermann, Markus Hösel, Henrik F. Dam, Mikkel Jørgensen, Suren Gevorgyan, Laurence Lutsen, Dirk Vanderzande, Harald Hoppe, Roland Rösch, Uli Würfel, Ronn Andriessen, Agnès Rivaton, Gülşah Y. Uzunoğlu, David Germack, Birgitta Andreasen, Morten V. Madsen, Eva Bundgaard, Frederik C. Krebs
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1551472647