Work

Transmission electron microscopy determination of quantum dot profile

Year: 2002

Type: conference-paper

Source: Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD)

DOI: 10.1109/commad.1998.791594

Authors: X.Z. Liao, J. Zou, X.F. Duan, D.J.H. Cockayne, R. Leon, C. Lobo

Institutions: The University of Sydney, Jet Propulsion Laboratory, Australian National University

Language: English

Topic: Semiconductor Quantum Structures and Devices

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Australian Research Council

OpenAlex ID: W1551897397

FWCI:

Cites: 11

Cited by: 1

Related to: 10