Work

Lumen throughput in front and rear projection systems: color fidelity impact

Year: 2004

Type: conference-paper

Source: IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS)

DOI: 10.1109/leos.2003.1253050

Author: M.L. Jepsen

Institution: Tokai University

Language: English

Topic: Advanced Optical Imaging Technologies

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1558084935

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