Work

Electrical Characterization of VLSI RAMs and PROMs.

Year: 1986

Type: report

Source: Defense Technical Information Center (DTIC)

DOI: 10.21236/ada180114

Authors: M. Formoso, D. Giammarrusco, G. Hornbuckle, R. Henrikson, E. Rolley

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1571659005

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